Scanning Probe Microscopy

CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

Anasys Instruments

-NanoIR2 (AFM + IR)

-NanoIR2-s (-AFM-IR + SNOM)

Nanonics

-Microscopy SNOM

Accessoires

- AFM Probes

Vacuum Technology

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Sample holders

- Instruments

- Accessories

- Electronics

- Software

2D/3D optical profilometry

KLA Tencor

- Interferometer

Toho Technology

- Stress measurement

Alicona

- Roughness and form

Lyncee Tec

- 3D dynamic holography

- Reflectometer

- Memstool

Nano-Indentation

Nanomechanics

- Indenter In-Situ

- Nano-Indenter

- Nano-Indenter (ambient & vacuum)

Thin film

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

Mechanical Profilometry

KLA Tencor

- Profilometer

Toho Technology

- Profilometer large sample