Scanning Probe Microscopy

CSInstruments

- Nano-Observer AFM

- ResiScope current and resistance measurements

Anasys Instruments

-NanoIR2 (AFM + IR)

-NanoIR2-s (AFM-IR + SNOM)

-mIRage (sub-µm IR spectroscopy)

Nanonics

-Microscopy SNOM

Accessoires

- AFM Probes

Vacuum Technology

Prevac

- Ultra High Vacuum systems

- Manipulators, goniometer...

- Sample holders

- Instruments

- Accessories

- Electronics

- Software

3D industrial metrology

Alicona

- Roughness and form

Thin film

Filmetrics

- Spectrale measurement

- Measurement of thickness

- Optical constant

Nano-Indentation

KLA Tencor

- Indenter In-Situ

- Nano-Indenter
- Nano-Indenter (ambient & vacuum)

- NanoIndenteur G200

- T150 UTM
- NanoSuite

2D/3D optical profilometry

KLA Tencor

- Interferometer

Toho Technology

- Stress measurement

Alicona

- Roughness and form

Lyncee Tec

- 3D dynamic holography

- Reflectometer

- Memstool

Filmetrics

- Optical profilometer

Mechanical Profilometry

KLA Tencor

- Profilometer

Toho Technology

- Profilometer large sample