Oscillating mode

• Applications: all types of materials (polymers, metals, ceramics, semiconductors ...).
• ACT (hard): ACT probes are silicon probes with a high spring constant for hard tapping measurements. These probes have a high frequency which allows faster scanning speeds.
• ACL (hard): ACL probes are silicon probes with a high spring constant for hard tapping measurements. These probes have an average frequency which allows different capacities in phase imaging.
• ACST (medium): ACST probes are silicon probes with average spring constant for the average tapping measurements (average force). These probes have a medium frequency which allows faster scanning speeds with medium force.
• FORT (soft): FORT probes are silicon probes with low spring constant for soft tapping measurements (weak force). These probes have a low frequency which allows flexible samples and liquid measurements.
• ACCESS series: the ACCESS-NC / FM probes are pointed silicon probes which allow a direct optical vision of the AFM tip and designed for applications requiring to see the tip in contact with the surface.
• ACCESS-NC has the same specifications as ACT and ACCESS-FM has the same specifications as FORT.

Contact mode

• Applications: all types of materials in air or in a liquid (except soft sample in air).
• ACCESS-C: ACCESS-C probes are pointed silicon probes allowing a direct optical view of the AFM tip and designed for applications requiring to see the tip in contact with the surface.
• Hydra-All: 4 triangular cantilevers in silicon nitride on a chip with different spring constants that allow different forces on the surface.

Conductor modes / Resiscope / EFM / KFM / PFM modes

• Applications: electrical measurements.
• Doped diamond: The end side of these probes is covered with polycrystalline diamond. The diamond film is doped in situ with boron to make it highly conductive. 1.6 spring constant is compatible for EFM and KFM modes.
• ANSCM: ANSCM probes are silicon probes with a thin layer of Pt / Ir coating, both reflex and probe ends. 2.7 spring constant ANSCM probes are ideal for EFM and KFM applications and are available for use in CAFM mode.

High resolution diamond probes (Driver / Resiscope / EFM / KFM / PFM modes)

• Applications: electrical measurements.
  Highly conductive diamond probes, formed according to a unique patented process, guarantee the best possible wear
  and electrical performance. These tips are sharper and last longer than any other electric AFM probe.

Magnetic force microscopy mode

• Applications: Measurement of magnetic domains.
  MAGT series probes are coated with Cr / Co and have a different coercivity and moment to match the different MFMs
• MAGT: MAGT have a coating of magnetic material with coercivity and average moment.
• MAGT-LM: MAGT-LM probes have medium coercivity and a coating of magnetic material at low moment.
• MAGT-HM: MAGT-HM probes have a medium coercivity and a coating of magnetic material at high moment.

Force modulation mode

• Applications: Flexible sample and polymers.
• FORT (soft): FORT probes are silicon probes with low spring constant for modulating the force of the measurements.
  Special probes
• HART: HART probes have been designed for metrology of trench depth: each probe end contains a tip of a specific length which is precisely adjusted to measure the depth in tapping / contactless mode.
• Super Sharp: Super-Sharp silicon probes designed for contactless, tapping, intermittent contact, and / or close contact applications. Our Super Sharp probes produce images with improved resolution.