Nanoindenter up to 1 N force iMicro 1. Accurate, flexible and user-friendly 2. Wide range of nanomechanical tests 3. Hard materials, high loads, great depth (> 1N of force) The iMicro Nanoindenter is a precise, flexible and user-friendly instrument that allows a wide range of nanomechanical tests, including module and hardness (Oliver and Pharr, ISO […]
Nanoindenter up to 50 mN of force iNano 1. Accurate, flexible and user-friendly 2. Wide range of nanomechanical tests 3. Thin films and soft materials (> 50 mN of force) The INano Nanoindenter is a precise, flexible and user-friendly instrument allowing a wide range of nanomechanical tests, including the module and the hardness (Oliver […]
Universal Test Machine T150 UTM 1. Complete means of nanomechanical characterization 2. Simple fibers, biomaterials and polymers 3. Wide dynamic range & high resolution The T150 UTM tensile tester provides users with a complete nanomechanical characterization tool for the study of simple fibers, biomaterials and polymers. Thanks to its wide dynamic range and high […]
Ambient & Vacuum Nanoindenter NanoFlip 1. Ambient conditions, under vacuum 2. Hardness, young’s modulus, elastic limit and other nanomechanical tests 3. In situ test The NanoFlip nanoindentor measures hardness, modulus, yield strength and other nanomechanical tests under ambient and vacuum conditions. The vacuum compatible NanoFlip performs in situ testing in scanning electron microscope (SEM) […]
Reflectometers Adaptable to microscope F40 1. Spot as small as 1 micron 2. Connection to the simple microscope 3. Precise monitoring of the measuring point 4. Wide measuring range The F40 family of products is intended for applications requiring a spot size as small as 1 micron. For most microscopes, the F40 simply connects to […]
Nanoindenter for High temperature InSEM HT 1. Mechanical properties at high temperature under vacuum 2. Deformations in real time, 3. Compatible with scanning electron microscope (SEM) and focused ion beam (FIB) chambers, or autonomous vacuum chambers The KLA InSEM® HT (high temperature) test system allows mechanical properties to be tested at high temperature under vacuum […]
Spot measurement F20 1. Simple configuration from 10,000 € 2. 10Å to 10mm 3. Quick measurement 4. Wide measuring range The F20, F10 and F3 are general purpose film thickness measuring instruments and are used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. Like all our […]
Automated thin-film thickness mapping F50 1. Quick mapping 2. Sample up to 450mm in diameter 3. Many card models 4. Customizable 5. Automated The Filmetrics F50 family of products can map film thickness as quickly as two dots per second. A motorized R-Theta stage accepts standard and personalized mandrels for samples up to 450 mm […]
Multi-site / In-situ reflectometers F30 1. Significantly improves productivity 2. best value for money 3. Fast and precise 4. Easy to use 5. Turnkey system The most powerful tool available to monitor the deposition of thin layers Measure deposition rates, film thickness, optical constants (n and k) and uniformity of semiconductors and dielectric layers in […]
Mechanical profilometer with the best quality / price ratio P7 1. Height of steps from a few nanometers to a millimeter 2. Production and R&D 3. 150mm plate 4. Manual 360 ° rotation 5. 2D and 3D measurements 6. Roughness, bow and constraints The P-7 builds on the success of the market-leading P-17 table stylus […]
Mechanical profilometer for industry P17 1. Efficient 2. High resolution 3. Industry and R&D 4. Fully motorized 5. 200mm plate (optional 300mm) 6. 360 ° rotation The P-17 is an advanced benchtop stylus profiler, based on over 40 years of experience in surface metrology. The P-17 is capable of measuring steps from a few nanometers […]
Mechanical profilometer from nanometer to millimeter D600 1. Programming of recipes for automated measurements 2. Low downforce 3. 200mm plate 4. Manual 360 ° rotation 5. Central aspiration 6. Double optical detector The Alpha-Step D-600 profilometer is capable of measuring 2D and 3D step heights ranging from a few nanometers to 1200 µm. It also […]