Deposit systems Family of deposit systems 1. MBE 2. PLD 3. CVD 4. HIPIMS 5. Sputter deposition 6. Thermal evaporation 7. … PREVAC is a world leader in the manufacture of UHV scientific research and investigation instruments on the chemical and physical properties of semiconductor surfaces, thin layers and nanomaterials. PREVAC also designs customized deposit […]
Analysis systems Family of Analysis systems 1. XPS 2. NAP-XPS 3. ARPES 4. FTIR 5. AFM 6. ISS 7. ARUPS 8. … PREVAC is a world leader in the manufacture of UHV scientific research and investigation instruments on the chemical and physical properties of semiconductor surfaces, thin layers and nanomaterials. PREVAC also designs customized deposit […]
UHV accessories and instruments Wide range of customized products 1. Instruments 2. Manipulators 3. Chamber 4. Sample holder 5. Accessories 6. Electronics PREVAC is a world leader in the manufacture of UHV scientific research and investigation instruments on the chemical and physical properties of semiconductor surfaces, thin layers and nanomaterials. PREVAC also designs customized deposit […]
Simultaneous sub-µm IR and Raman microscopy Simultaneous IR and Raman submicron microscopy The world’s first IR + Raman simultaneous microscopy system is a unique dual-mode platform that combines all the benefits of O-PTIR with complementary Raman microscopy through the simultaneous detection of the visible probe laser. Spectra, line scans and 2D maps can now be […]
Raman Confocal Microscope MonoVista CRS+ 1. Complex measurement system with simple handling 2. Excellent high-end spectroscopy performance 3. Low frequency measurements with single spectrometer 4. High speed Raman mapping 5. Quick Raman Mapping configuration to create Raman-Maps with 10,000 spectra in a few minutes 6. Maximum flexibility and optional improvements 7. Large selection of microscopes, […]
Raman Confocal S&I Microscope TriVista CRS 1. Additive and subtractive dispersion 2. Unbeatable spectral resolution 3. Lowest frequency measurements up to 5 cm-1 or less 4. Variable excitation-wavelength experiments supported 5. Maximum flexibility and optional improvements Functionality Triple spectrometer / spectrographs at different focal lengths – TR 555 with focal length 3 x 500 […]
Submicron InfraRed Spectroscopy mIRage 1. Infrared Optical Photothermal Spectroscopy (O-PTIR), a unique technology 2. IR submicron spatial resolution in non-contact reflection mode independent of the IR wavelength 3. Ease of use (no sample preparation) 4. Spectra on thick samples in contactless mode correlated to FTIR transmission 5. IR and RAMAN at the same time and […]
Optical Photothermal Infrared spectroscopy O-PTIR 1. Submicron infrared spatial resolution 2. Non-contact measurement 3. Technique not requiring sample preparation 4. Convenience of a contactless reflection technique 5. Quality of the FTIR transmission spectra. IR spectroscopy mIRage : Submicron InfraRed Spectroscopy > IRaman : At the same time in the same place with the same […]
2D mechanical profilometer D500 1. 2D profilometry 2. 150mm plate 3. Manual XY motorization and 360 ° rotation 4. Low downforce 5. Double optical detector The Alpha-Step D-500 mechanical profilometer is capable of measuring 2D step heights ranging from a few nanometers to 1200 µm. It also supports 2D roughness, arc and stress measurements for […]
Large samples mechanical profilometer FP Series 1. Large samples from 200 to 500mm 2. KLA measuring heads 3. Sub-nanometric vertical precision 4. Long sweep strokes 5. Repositioning of high reproducibility Toho Technology offers surface metrology solutions suitable for large samples (from 200 to 500mm). Using KLA measurement heads, FP series performance achieves sub-nanometric vertical accuracy. […]
Optical profilometer at the best quality / price Profilm3D 1. Sub-nanometric vertical resolution with 500µm piezoelectric scanning 2. Vertical scanning interferometry (VSI) and phase shift (PSI) 3. Advanced analysis software 4. Motorized stage 5. Objective detection 6. Easy to use 7. Stiching function Finally, measurements of surface roughness and topography can be made with an […]
Optical profilometer for R&D Zeta-20 1. Versatility and Performance 2. Punctual measurement 3. High resolution 3D topography in color even on transparent sample 4. Interferometric: white light VSI – Nomarski – PSI 5. Thickness of transparent thin layers The Zeta-20 is a fully integrated optical profilometer that provides 3D metrology and imaging capacity in a […]